Ph.D. student Ben Herzog posing infront of the 3He system during preparations for a magnetic resonance force microscopy (MRFM) experiment in March of 2010.
On Friday, May 11th, 2018, the group went on a day-long bicycle tour of nearby Alsace, France.
Prof. Poggio and Ph.D. student Davide Cadeddu are shown here with our custom-made 3He scanning probe microscope.
A new type of atomic force microscope (AFM) uses nanowires as tiny sensors. Unlike standard AFM, the device with a nanowire sensor enables measurements of both the size and direction of forces.
In December 2014, the group was featured in a Swiss Nanoscience Institute (SNI) video on the Masters and Ph.D. school on nanoscience here at the University of Basel. (Video)
A photo of our new custom-built low-tempearture high-vacuum scanning nanowire microscope.